Analyze log patterns, metrics and Jaeger traces with new observability features in Amazon OpenSearch Service
Today we launched new observability features including log patterns, metrics analytics and support for Jaeger traces with OpenSearch 2.5 in Amazon OpenSearch Service.
Today we launched new observability features including log patterns, metrics analytics and support for Jaeger traces with OpenSearch 2.5 in Amazon OpenSearch Service.
Log patterns provide automated grouping of log data, which can be used to provide new insights into large volumes of log data. These groupings help to detect outliers in large volumes of data, which helps improve your signal to noise ratio and allows you to identify uninteresting logs to optimize storage costs. With the new metrics analytics interface, you can now visualize multiple log-generated metrics like throughput, errors and response times in a single interface and correlate these metrics. The newly added support for popular open source Jaeger format allows you to use the capabilities of OpenSearch to analyze the trace data stored in this format. This expands on the existing support for OTEL format trace data.
The new observability capabilities and log monitoring features are available on the Amazon OpenSearch Service domains running OpenSearch version 2.5 or higher in the AWS Regions where Amazon OpenSearch Service is available. Please refer to the AWS Region Table for more information about Amazon OpenSearch Service availability.
For more information, follow these links: Documentation about observability in OpenSearch version 2.5; the observability solution in OpenSearch Service; documentation for Jaeger support, metrics analytics and log patterns.